"Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise ..."

Junxia Ma, Mohammad Tehranipoor (2011)

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DOI: 10.1109/TCAD.2011.2163159

access: closed

type: Journal Article

metadata version: 2020-09-24

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Junxia Ma, Mohammad Tehranipoor:
Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1923-1934 (2011)

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