"Training Data Poisoning in ML-CAD: Backdooring DL-Based Lithographic ..."

Kang Liu et al. (2021)

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DOI: 10.1109/TCAD.2020.3024780

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type: Journal Article

metadata version: 2023-08-28

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Kang Liu, Benjamin Tan, Ramesh Karri, Siddharth Garg:
Training Data Poisoning in ML-CAD: Backdooring DL-Based Lithographic Hotspot Detectors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(6): 1244-1257 (2021)

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