"A Comprehensive Evaluation of Integrated Circuits Side-Channel Resilience ..."

Yanjiang Liu et al. (2022)

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DOI: 10.1109/TCAD.2021.3128364

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type: Journal Article

metadata version: 2022-10-18

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Yanjiang Liu, Jiaji He, Haocheng Ma, Tongzhou Qu, Zibin Dai:
A Comprehensive Evaluation of Integrated Circuits Side-Channel Resilience Utilizing Three-Independent-Gate Silicon Nanowire Field Effect Transistors-Based Current Mode Logic. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(10): 3228-3238 (2022)

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