"A Hybrid Test Scheme for Automotive IC in Multisite Testing."

Hyeonchan Lim, Hyojoon Yun, Sungho Kang (2022)

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DOI: 10.1109/TCAD.2022.3160406

access: closed

type: Journal Article

metadata version: 2024-02-27

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Hyeonchan Lim, Hyojoon Yun, Sungho Kang:
A Hybrid Test Scheme for Automotive IC in Multisite Testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(12): 5671-5680 (2022)

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