"An Efficient On-Chip Test Generation Scheme Based on Programmable and ..."

Wei-Cheng Lien et al. (2013)

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DOI: 10.1109/TCAD.2013.2253155

access: closed

type: Journal Article

metadata version: 2021-10-14

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Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Wee-Lung Ang:
An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(8): 1254-1264 (2013)

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