"Enhancing Test Compression With Dependency Analysis for Multiple Expansion ..."

Taehee Lee, Nur A. Touba, Joon-Sung Yang (2017)

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DOI: 10.1109/TCAD.2017.2681063

access: closed

type: Journal Article

metadata version: 2020-09-24

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Taehee Lee, Nur A. Touba, Joon-Sung Yang:
Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(9): 1571-1579 (2017)

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