"Fault Group Pattern Matching With Efficient Early Termination for ..."

Hayoung Lee et al. (2018)

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DOI: 10.1109/TCAD.2017.2760505

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type: Journal Article

metadata version: 2024-02-27

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Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang:
Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1473-1482 (2018)

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