"Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault ..."

Sunghoon Kim, Seokjun Jang, Sungho Kang (2023)

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DOI: 10.1109/TCAD.2022.3224899

access: closed

type: Journal Article

metadata version: 2024-02-27

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Sunghoon Kim, Seokjun Jang, Sungho Kang:
Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(8): 2717-2727 (2023)

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