"Built-In Test for Hidden Delay Faults."

Matthias Kampmann et al. (2019)

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DOI: 10.1109/TCAD.2018.2864255

access: closed

type: Journal Article

metadata version: 2020-09-24

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Matthias Kampmann, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, Hans-Joachim Wunderlich:
Built-In Test for Hidden Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1956-1968 (2019)

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