"An Advanced BIRA for Memories With an Optimal Repair Rate and Fast ..."

Woosik Jeong et al. (2010)

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DOI: 10.1109/TCAD.2010.2062830

access: closed

type: Journal Article

metadata version: 2020-09-24

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Woosik Jeong, Joohwan Lee, Taewoo Han, Kaangchil Lee, Sungho Kang:
An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(12): 2014-2026 (2010)

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