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"Diagnosis of clustered faults and wafer testing."
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thulasiraman (1998)
- Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thulasiraman:
Diagnosis of clustered faults and wafer testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(2): 136-148 (1998)
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