"Built-In Test and Diagnosis for TSVs With Different Placement Topologies ..."

Wen-Hsuan Hsu, Michael Andreas Kochte, Kuen-Jong Lee (2017)

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DOI: 10.1109/TCAD.2016.2613928

access: closed

type: Journal Article

metadata version: 2020-09-24

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Wen-Hsuan Hsu, Michael Andreas Kochte, Kuen-Jong Lee:
Built-In Test and Diagnosis for TSVs With Different Placement Topologies and Crosstalk Impact Ranges. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(6): 1004-1017 (2017)

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