"A Study of Variance Reduction Techniques for Estimating Circuit Yields."

Dale E. Hocevar, Michael R. Lightner, Timothy N. Trick (1983)

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DOI: 10.1109/TCAD.1983.1270035

access: closed

type: Journal Article

metadata version: 2020-09-24

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Dale E. Hocevar, Michael R. Lightner, Timothy N. Trick:
A Study of Variance Reduction Techniques for Estimating Circuit Yields. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2(3): 180-192 (1983)

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