"On the Impact of Within-Die Process Variation in GALS-Based NoC Performance."

Carles Hernández et al. (2012)

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DOI: 10.1109/TCAD.2011.2170071

access: closed

type: Journal Article

metadata version: 2023-12-18

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Carles Hernández, Antoni Roca, Federico Silla, José Flich, José Duato:
On the Impact of Within-Die Process Variation in GALS-Based NoC Performance. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(2): 294-307 (2012)

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