"Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple ..."

Taewoo Han et al. (2016)

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DOI: 10.1109/TCAD.2015.2481872

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type: Journal Article

metadata version: 2024-02-27

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Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(7): 1219-1223 (2016)

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