"Thorough testing of any multiport memory with linear tests."

Said Hamdioui, Ad J. van de Goor (2002)

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DOI: 10.1109/43.980260

access: closed

type: Journal Article

metadata version: 2020-09-24

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Said Hamdioui, Ad J. van de Goor:
Thorough testing of any multiport memory with linear tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(2): 217-231 (2002)

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