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"IC defect sensitivity for footprint-type spot defects."

José Pineda de Gyvez, Chennian Di (1992)

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DOI: 10.1109/43.127625

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/GyvezD92
José Pineda de Gyvez, Chennian Di:
IC defect sensitivity for footprint-type spot defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(5): 638-658 (1992)

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