"Efficient Rare Failure Analysis Over Multiple Corners via Correlated ..."

Zhengqi Gao et al. (2020)

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DOI: 10.1109/TCAD.2019.2949524

access: closed

type: Journal Article

metadata version: 2020-10-06

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Zhengqi Gao, Jun Tao, Yangfeng Su, Dian Zhou, Xuan Zeng, Xin Li:
Efficient Rare Failure Analysis Over Multiple Corners via Correlated Bayesian Inference. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2029-2041 (2020)

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