"Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values."

Dominik Erb et al. (2015)

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DOI: 10.1109/TCAD.2015.2440315

access: closed

type: Journal Article

metadata version: 2023-03-21

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Dominik Erb, Michael A. Kochte, Sven Reimer, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker:
Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(12): 2025-2038 (2015)

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