"Fault detection and classification in linear integrated circuits: an ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Benjamin R. Epstein, Martin H. Czigler, Steven R. Miller (1993)

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DOI: 10.1109/43.184847

access: closed

type: Journal Article

metadata version: 2020-09-24

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Benjamin R. Epstein, Martin H. Czigler, Steven R. Miller:
Fault detection and classification in linear integrated circuits: an application of discrimination analysis and hypothesis testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(1): 102-113 (1993)

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