"Modeling and Experimental Measurement of Active Substrate-Noise ..."

Haitao Dai, Ronald W. Knepper (2009)

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DOI: 10.1109/TCAD.2009.2016545

access: closed

type: Journal Article

metadata version: 2020-09-24

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Haitao Dai, Ronald W. Knepper:
Modeling and Experimental Measurement of Active Substrate-Noise Suppression in Mixed-Signal 0.18µm BiCMOS Technology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(6): 826-836 (2009)

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