"GATTO: a genetic algorithm for automatic test pattern generation for large ..."

Fulvio Corno et al. (1996)

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DOI: 10.1109/43.511578

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type: Journal Article

metadata version: 2020-09-24

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Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda:
GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(8): 991-1000 (1996)

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