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"Neighborhood pattern-sensitive fault testing and diagnostics for ..."

Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu (2002)

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DOI: 10.1109/TCAD.2002.804101

access: closed

type: Journal Article

metadata version: 2023-09-30

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Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu:
Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(11): 1328-1336 (2002)

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