"Hardware Protection via Logic Locking Test Points."

Michael Chen et al. (2018)

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DOI: 10.1109/TCAD.2018.2801240

access: closed

type: Journal Article

metadata version: 2020-09-24

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Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
Hardware Protection via Logic Locking Test Points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(12): 3020-3030 (2018)

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