"Fast Test Integration: Toward Plug-and-Play At-Speed Testing of Multiple ..."

Po-Lin Chen, Yu-Chieh Huang, Tsin-Yuan Chang (2010)

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DOI: 10.1109/TCAD.2010.2055010

access: closed

type: Journal Article

metadata version: 2020-09-24

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Po-Lin Chen, Yu-Chieh Huang, Tsin-Yuan Chang:
Fast Test Integration: Toward Plug-and-Play At-Speed Testing of Multiple Clock Domains Based on IEEE Standard 1500. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(11): 1837-1842 (2010)

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