"Design of efficient BIST test pattern generators for delay testing."

Chih-Ang Chen, Sandeep K. Gupta (1996)

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DOI: 10.1109/43.552090

access: closed

type: Journal Article

metadata version: 2020-09-24

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Chih-Ang Chen, Sandeep K. Gupta:
Design of efficient BIST test pattern generators for delay testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(12): 1568-1575 (1996)

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