"A unified approach to reduce SOC test data volume, scan power and testing ..."

Anshuman Chandra, Krishnendu Chakrabarty (2003)

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DOI: 10.1109/TCAD.2002.807895

access: closed

type: Journal Article

metadata version: 2022-01-03

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Anshuman Chandra, Krishnendu Chakrabarty:
A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 352-363 (2003)

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