"Low-power scan testing and test data compression forsystem-on-a-chip."

Anshuman Chandra, Krishnendu Chakrabarty (2002)

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DOI: 10.1109/43.998630

access: closed

type: Journal Article

metadata version: 2022-01-03

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Anshuman Chandra, Krishnendu Chakrabarty:
Low-power scan testing and test data compression forsystem-on-a-chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(5): 597-604 (2002)

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