"Static noise analysis for digital integrated circuits in partially ..."

Steven C. Chan, Kenneth L. Shepard, Dae-Jin Kim (2002)

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DOI: 10.1109/TCAD.2002.800461

access: closed

type: Journal Article

metadata version: 2020-09-24

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Steven C. Chan, Kenneth L. Shepard, Dae-Jin Kim:
Static noise analysis for digital integrated circuits in partially depleted silicon-on-insulator technology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(8): 916-927 (2002)

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