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"On the quality of accumulator-based compaction of test responses."

Krishnendu Chakrabarty, John P. Hayes (1997)

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DOI: 10.1109/43.644618

access: closed

type: Journal Article

metadata version: 2022-01-03

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Krishnendu Chakrabarty, John P. Hayes:
On the quality of accumulator-based compaction of test responses. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(8): 916-922 (1997)

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