"Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate ..."

Ahcène Bounceur et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TCAD.2019.2907923

access: closed

type: Journal Article

metadata version: 2020-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/BounceurMEB20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/BounceurMEB20
Ahcène Bounceur, Salvador Mir, Reinhardt Euler, Kamel Beznia:
Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(5): 966-976 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.