"On-Chip Diagnosis of Generalized Delay Failures Using Compact Fault ..."

Matthew Layne Beckler, Ronald D. Blanton (2019)

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DOI: 10.1109/TCAD.2018.2803621

access: closed

type: Journal Article

metadata version: 2020-09-24

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Matthew Layne Beckler, Ronald D. Blanton:
On-Chip Diagnosis of Generalized Delay Failures Using Compact Fault Dictionaries. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(2): 322-334 (2019)

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