"New fault models and efficient BIST algorithms for dual-port memories."

Alaaeldin A. Amin et al. (1997)

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DOI: 10.1109/43.658567

access: closed

type: Journal Article

metadata version: 2020-09-24

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Alaaeldin A. Amin, Mohamed Y. Osman, Radwan E. Abdel-Aal, Husni Al-Muhtaseb:
New fault models and efficient BIST algorithms for dual-port memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(9): 987-1000 (1997)

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