"A yield improvement technique for IC layout using local design rules."

Gerard A. Allan, Anthony J. Walton, Robert J. Holwill (1992)

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DOI: 10.1109/43.177399

access: closed

type: Journal Article

metadata version: 2020-09-24

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Gerard A. Allan, Anthony J. Walton, Robert J. Holwill:
A yield improvement technique for IC layout using local design rules. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(11): 1355-1362 (1992)

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