"Reuse-Based Optimization for Prebond and Post-Bond Testing of 3-D-Stacked ICs."

Mukesh Agrawal, Krishnendu Chakrabarty, Randy Widialaksono (2015)

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DOI: 10.1109/TCAD.2014.2369747

access: closed

type: Journal Article

metadata version: 2023-03-09

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Mukesh Agrawal, Krishnendu Chakrabarty, Randy Widialaksono:
Reuse-Based Optimization for Prebond and Post-Bond Testing of 3-D-Stacked ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(1): 122-135 (2015)

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