"Defect-Oriented Testing of RF Circuits."

Erkan Acar, Sule Ozev (2008)

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DOI: 10.1109/TCAD.2008.917578

access: closed

type: Journal Article

metadata version: 2020-09-24

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Erkan Acar, Sule Ozev:
Defect-Oriented Testing of RF Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(5): 920-931 (2008)

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