"Nonscan Design for Testability for Synchronous Sequential Circuits Based ..."

Dong Xiang, Yi Xu, Hideo Fujiwara (2003)

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DOI: 10.1109/TC.2003.1223640

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/tc/XiangXF03
Dong Xiang, Yi Xu, Hideo Fujiwara:
Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution. IEEE Trans. Computers 52(8): 1063-1075 (2003)

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