"Using Weighted Scan Enable Signals to Improve Test Effectiveness of ..."

Dong Xiang, Mingjing Chen, Hideo Fujiwara (2007)

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DOI: 10.1109/TC.2007.70767

access: closed

type: Journal Article

metadata version: 2022-06-13

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Dong Xiang, Mingjing Chen, Hideo Fujiwara:
Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BIST. IEEE Trans. Computers 56(12): 1619-1628 (2007)

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