"Characterization, Modeling, and Test of Intermediate State Defects in ..."

Lizhou Wu et al. (2022)

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DOI: 10.1109/TC.2021.3125228

access: closed

type: Journal Article

metadata version: 2023-09-30

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Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs. IEEE Trans. Computers 71(9): 2219-2233 (2022)

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