"Enhancing Testability of Large-Scale Integrated Circuits via Test Points ..."

Michael J. Y. Williams, James B. Angell (1973)

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DOI: 10.1109/T-C.1973.223600

access: closed

type: Journal Article

metadata version: 2018-11-14

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Michael J. Y. Williams, James B. Angell:
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic. IEEE Trans. Computers 22(1): 46-60 (1973)

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