"Equivalence Proofs of Some Yield Modeling Methods for Defect-Tolerant ..."

Claude Thibeault, Yvon Savaria, Jean-Louis Houle (1995)

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DOI: 10.1109/12.381962

access: closed

type: Journal Article

metadata version: 2017-05-20

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Claude Thibeault, Yvon Savaria, Jean-Louis Houle:
Equivalence Proofs of Some Yield Modeling Methods for Defect-Tolerant Integrated Circuits. IEEE Trans. Computers 44(5): 724-728 (1995)

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