"Logic Test Pattern Generation Using Linear Codes."

Donald T. Tang, Chin-Long Chen (1984)

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DOI: 10.1109/TC.1984.1676501

access: closed

type: Journal Article

metadata version: 2017-05-20

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Donald T. Tang, Chin-Long Chen:
Logic Test Pattern Generation Using Linear Codes. IEEE Trans. Computers 33(9): 845-850 (1984)

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