"Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs."

Yiorgos Sfikas, Yiorgos Tsiatouhas (2016)

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DOI: 10.1109/TC.2015.2479606

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/tc/SfikasT16
Yiorgos Sfikas, Yiorgos Tsiatouhas:
Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs. IEEE Trans. Computers 65(7): 2339-2345 (2016)

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