"Simple Bounds on Serial Signature Analysis Aliasing for Random Testing."

Nirmal R. Saxena, Piero Franco, Edward J. McCluskey (1992)

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DOI: 10.1109/12.142690

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/tc/SaxenaFM92
Nirmal R. Saxena, Piero Franco, Edward J. McCluskey:
Simple Bounds on Serial Signature Analysis Aliasing for Random Testing. IEEE Trans. Computers 41(5): 638-645 (1992)

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