"An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS ..."

Alodeep Sanyal et al. (2010)

> Home

Details and statistics

DOI: 10.1109/TC.2010.75

access: closed

type: Journal Article

metadata version: 2017-05-20

- view
  authority control:
- export record
  dblp key:
  - journals/tc/SanyalRCK10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/SanyalRCK10
Alodeep Sanyal, Ashesh Rastogi, Wei Chen, Sandip Kundu:
An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects. IEEE Trans. Computers 59(7): 922-932 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.