"Fault Analysis and Test Generation for Programmable Logic Arrays (PLA's)."

Daniel L. Ostapko, Se June Hong (1979)

> Home

Details and statistics

DOI: 10.1109/TC.1979.1675429

access: closed

type: Journal Article

metadata version: 2017-05-20

- view
  authority control:
- export record
  dblp key:
  - journals/tc/OstapkoH79
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/OstapkoH79
Daniel L. Ostapko, Se June Hong:
Fault Analysis and Test Generation for Programmable Logic Arrays (PLA's). IEEE Trans. Computers 28(9): 617-627 (1979)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.