"Compressed Test Pattern Generation for Deep Neural Networks."

Dina A. Moussa, Michael Hefenbrock, Mehdi B. Tahoori (2025)

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DOI: 10.1109/TC.2024.3457738

access: closed

type: Journal Article

metadata version: 2025-01-08

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Dina A. Moussa, Michael Hefenbrock, Mehdi B. Tahoori:
Compressed Test Pattern Generation for Deep Neural Networks. IEEE Trans. Computers 74(1): 307-315 (2025)

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