"Comments on "Ternary Scan Design for VLSI Testability"."

Robert F. Molyneaux, Alexander Albicki (1989)

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DOI: 10.1109/12.16502

access: closed

type: Journal Article

metadata version: 2017-05-20

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Robert F. Molyneaux, Alexander Albicki:
Comments on "Ternary Scan Design for VLSI Testability". IEEE Trans. Computers 38(2): 256-263 (1989)

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