"Fault Models and Test Methods for Subthreshold SRAMs."

Chen-Wei Lin et al. (2013)

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DOI: 10.1109/TC.2011.252

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/tc/LinCYHCH13
Chen-Wei Lin, Hung-Hsin Chen, Hao-Yu Yang, Chin-Yuan Huang, Mango Chia-Tso Chao, Rei-Fu Huang:
Fault Models and Test Methods for Subthreshold SRAMs. IEEE Trans. Computers 62(3): 468-481 (2013)

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