"Detecting Exitory Stuck-At Faults in Semimodular Asynchronous Circuits."

Michael J. Liebelt, Neil Burgess (1999)

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DOI: 10.1109/12.762538

access: closed

type: Journal Article

metadata version: 2018-11-24

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  - https://dblp.org/rec/journals/tc/LiebeltB99
Michael J. Liebelt, Neil Burgess:
Detecting Exitory Stuck-At Faults in Semimodular Asynchronous Circuits. IEEE Trans. Computers 48(4): 442-448 (1999)

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